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Bias-stress-induced creation and removal of dangling-bond states in amorphous silicon thin-film transistors

Powell, MJ and Deane, SC and Milne, WI (1992) Bias-stress-induced creation and removal of dangling-bond states in amorphous silicon thin-film transistors. Applied Physics Letters, 60. pp. 207-209. ISSN 0003-6951

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 11:34
Last Modified: 21 Apr 2014 01:10
DOI: 10.1063/1.106965

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