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Bias-stress-induced creation and removal of dangling-bond states in amorphous silicon thin-film transistors

Powell, MJ and Deane, SC and Milne, WI (1992) Bias-stress-induced creation and removal of dangling-bond states in amorphous silicon thin-film transistors. Applied Physics Letters, 60. pp. 207-209. ISSN 0003-6951

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 02 Sep 2016 16:27
Last Modified: 08 Dec 2016 03:06
DOI: