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Bias-stress-induced creation and removal of dangling-bond states in amorphous silicon thin-film transistors

Powell, MJ and Deane, SC and Milne, WI (1992) Bias-stress-induced creation and removal of dangling-bond states in amorphous silicon thin-film transistors. Applied Physics Letters, 60. pp. 207-209. ISSN 0003-6951

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: UNSPECIFIED
Depositing User: Cron job
Date Deposited: 04 Feb 2015 22:16
Last Modified: 05 Feb 2015 00:23
DOI: 10.1063/1.106965