CUED Publications database

Bias-stress-induced creation and removal of dangling-bond states in amorphous silicon thin-film transistors

Powell, MJ and Deane, SC and Milne, WI (1992) Bias-stress-induced creation and removal of dangling-bond states in amorphous silicon thin-film transistors. Applied Physics Letters, 60. pp. 207-209. ISSN 0003-6951

Full text not available from this repository.
Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 15 Dec 2015 13:13
Last Modified: 30 Apr 2016 04:48
DOI: 10.1063/1.106965