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Thermal bias annealing evidence for the defect pool in amorphous silicon thin-film transistors

Deane, SC and Milne, WI and Powell, MJ and Hughes, JR and French, I (1990) Thermal bias annealing evidence for the defect pool in amorphous silicon thin-film transistors. Applied Physics Letters, 57. pp. 1416-1418. ISSN 0003-6951

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Item Type: Article
Subjects: UNSPECIFIED
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Depositing User: Unnamed user with email sms67@cam.ac.uk
Date Deposited: 16 Jul 2015 13:14
Last Modified: 01 Aug 2015 22:08
DOI: 10.1063/1.103452