Deane, SC and Milne, WI and Powell, MJ and Hughes, JR and French, I (1990) Thermal bias annealing evidence for the defect pool in amorphous silicon thin-film transistors. Applied Physics Letters, 57. pp. 1416-1418. ISSN 0003-6951
Full text not available from this repository.| Item Type: | Article |
|---|---|
| Subjects: | UNSPECIFIED |
| Divisions: | UNSPECIFIED |
| Depositing User: | Cron Job |
| Date Deposited: | 28 Oct 2011 16:41 |
| Last Modified: | 11 Mar 2013 02:07 |
| DOI: | 10.1063/1.103452 |
Actions (login required)
| View Item |
