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Thermal bias annealing evidence for the defect pool in amorphous silicon thin-film transistors

Deane, SC and Milne, WI and Powell, MJ and Hughes, JR and French, I (1990) Thermal bias annealing evidence for the defect pool in amorphous silicon thin-film transistors. Applied Physics Letters, 57. pp. 1416-1418. ISSN 0003-6951

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 18 May 2016 19:04
Last Modified: 24 Aug 2016 04:38
DOI: