Deane, SC and Milne, WI and Powell, MJ and Hughes, JR and French, I (1990) Thermal bias annealing evidence for the defect pool in amorphous silicon thin-film transistors. Applied Physics Letters, 57. pp. 1416-1418. ISSN 0003-6951Full text not available from this repository.
|Divisions:||Div B > Solid State Electronics and Nanoscale Science|
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|Date Deposited:||09 Dec 2016 17:41|
|Last Modified:||26 Apr 2017 22:25|