CUED Publications database

Scanning tunnelling microscopy of ion etched Silicon

Bestwick, TD and Leane, RB and Welland, ME (1988) Scanning tunnelling microscopy of ion etched Silicon. Vacuum, 38. pp. 823-826. ISSN 0042-207X

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: UNSPECIFIED
Depositing User: Unnamed user with email sms67@cam.ac.uk
Date Deposited: 16 Jul 2015 13:44
Last Modified: 27 Aug 2015 21:55
DOI: 10.1016/0042-207X(88)90471-X