CUED Publications database

Scanning tunnelling microscopy of ion etched Silicon

Bestwick, TD and Leane, RB and Welland, ME (1988) Scanning tunnelling microscopy of ion etched Silicon. Vacuum, 38. pp. 823-826. ISSN 0042-207X

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Unnamed user with email sms67@cam.ac.uk
Date Deposited: 18 May 2016 18:42
Last Modified: 28 Aug 2016 00:30
DOI: