CUED Publications database

Spatial location of electron trapping defects on silicon by scanning tunneling microscopy

Welland, ME and Koch, RH (1986) Spatial location of electron trapping defects on silicon by scanning tunneling microscopy. Applied Physics Letters, 48. pp. 724-726. ISSN 0003-6951

Full text not available from this repository.
Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 11:34
Last Modified: 25 Aug 2014 01:13
DOI: 10.1063/1.96702

Actions (login required)

View Item