Welland, ME and Koch, RH (1986) Spatial location of electron trapping defects on silicon by scanning tunneling microscopy. Applied Physics Letters, 48. pp. 724-726. ISSN 0003-6951
Full text not available from this repository.| Item Type: | Article |
|---|---|
| Subjects: | UNSPECIFIED |
| Divisions: | UNSPECIFIED |
| Depositing User: | Cron Job |
| Date Deposited: | 28 Oct 2011 16:40 |
| Last Modified: | 11 Mar 2013 01:47 |
| DOI: | 10.1063/1.96702 |
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