CUED Publications database

Spatial location of electron trapping defects on silicon by scanning tunneling microscopy

Welland, ME and Koch, RH (1986) Spatial location of electron trapping defects on silicon by scanning tunneling microscopy. Applied Physics Letters, 48. pp. 724-726. ISSN 0003-6951

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Unnamed user with email sms67@cam.ac.uk
Date Deposited: 09 Dec 2016 17:38
Last Modified: 21 Feb 2017 22:53
DOI: