CUED Publications database

Spatial location of electron trapping defects on silicon by scanning tunneling microscopy

Welland, ME and Koch, RH (1986) Spatial location of electron trapping defects on silicon by scanning tunneling microscopy. Applied Physics Letters, 48. pp. 724-726. ISSN 0003-6951

Full text not available from this repository.
Item Type: Article
Subjects: UNSPECIFIED
Divisions: UNSPECIFIED
Depositing User: Unnamed user with email sms67@cam.ac.uk
Date Deposited: 16 Jul 2015 13:33
Last Modified: 27 Aug 2015 21:55
DOI: 10.1063/1.96702