CUED Publications database

Spatial location of electron trapping defects on silicon by scanning tunneling microscopy

Welland, ME and Koch, RH (1986) Spatial location of electron trapping defects on silicon by scanning tunneling microscopy. Applied Physics Letters, 48. pp. 724-726. ISSN 0003-6951

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: UNSPECIFIED
Depositing User: Cron job
Date Deposited: 04 Feb 2015 22:08
Last Modified: 07 May 2015 01:26
DOI: 10.1063/1.96702