CUED Publications database

Monte Carlo study of the kickout mechanism of boron diffusion in silicon

deSouza, MM and Amaratunga, GAJ (1996) Monte Carlo study of the kickout mechanism of boron diffusion in silicon. J APPL PHYS, 79. pp. 2418-2425. ISSN 0021-8979

Full text not available from this repository.
Item Type: Article
Uncontrolled Keywords: POINT-DEFECTS SYSTEM
Subjects: UNSPECIFIED
Divisions: Div B > Electronics, Power & Energy Conversion
Depositing User: Cron Job
Date Deposited: 15 Dec 2015 12:48
Last Modified: 30 Apr 2016 05:44
DOI: