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DETERMINATION OF THE OPTICAL-CONSTANTS AND THICKNESS OF THIN-FILMS ON SLIGHTLY ABSORBING SUBSTRATES

RUSLI, and AMARATUNGA, GAJ (1995) DETERMINATION OF THE OPTICAL-CONSTANTS AND THICKNESS OF THIN-FILMS ON SLIGHTLY ABSORBING SUBSTRATES. APPL OPTICS, 34. pp. 7914-7924. ISSN 0003-6935

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Item Type: Article
Uncontrolled Keywords: OPTICAL CONSTANTS THIN FILMS SI REFLECTANCE COATING MATERIALS DIAMOND SILICON SI
Subjects: UNSPECIFIED
Divisions: Div B > Electronics, Power & Energy Conversion
Depositing User: Cron Job
Date Deposited: 15 Dec 2015 13:43
Last Modified: 10 Feb 2016 03:29
DOI: