RUSLI, and AMARATUNGA, GAJ (1995) DETERMINATION OF THE OPTICAL-CONSTANTS AND THICKNESS OF THIN-FILMS ON SLIGHTLY ABSORBING SUBSTRATES. APPL OPTICS, 34. pp. 7914-7924. ISSN 0003-6935
Full text not available from this repository.| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | OPTICAL CONSTANTS THIN FILMS SI REFLECTANCE COATING MATERIALS DIAMOND SILICON SI |
| Subjects: | UNSPECIFIED |
| Divisions: | Div B > Electronics, Power & Energy Conversion |
| Depositing User: | Cron Job |
| Date Deposited: | 17 Jul 2017 19:34 |
| Last Modified: | 03 Aug 2017 03:07 |
| DOI: |
