RUSLI, and AMARATUNGA, GAJ (1995) DETERMINATION OF THE OPTICAL-CONSTANTS AND THICKNESS OF THIN-FILMS ON SLIGHTLY ABSORBING SUBSTRATES. APPL OPTICS, 34. pp. 7914-7924. ISSN 0003-6935
Full text not available from this repository.Item Type: | Article |
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Uncontrolled Keywords: | OPTICAL CONSTANTS THIN FILMS SI REFLECTANCE COATING MATERIALS DIAMOND SILICON SI |
Subjects: | UNSPECIFIED |
Divisions: | Div B > Electronics, Power & Energy Conversion |
Depositing User: | Cron Job |
Date Deposited: | 17 Jul 2017 19:34 |
Last Modified: | 16 Mar 2021 07:03 |
DOI: |