RUSLI, and AMARATUNGA, GAJ (1995) DETERMINATION OF THE OPTICAL-CONSTANTS AND THICKNESS OF THIN-FILMS ON SLIGHTLY ABSORBING SUBSTRATES. APPL OPTICS, 34. pp. 7914-7924. ISSN 0003-6935
Full text not available from this repository.
| Item Type: | Article |
|---|
| Uncontrolled Keywords: | OPTICAL CONSTANTS THIN FILMS SI REFLECTANCE COATING MATERIALS DIAMOND SILICON SI |
|---|
| Subjects: | UNSPECIFIED |
|---|
| Divisions: | Div B > Electronics, Power & Energy Conversion |
|---|
| Depositing User: | Cron Job |
|---|
| Date Deposited: | 31 May 2013 15:10 |
|---|
| Last Modified: | 14 Oct 2013 01:16 |
|---|
| DOI: | |
|---|
Actions (login required)
