RUSLI, and AMARATUNGA, GAJ (1995) DETERMINATION OF THE OPTICAL-CONSTANTS AND THICKNESS OF THIN-FILMS ON SLIGHTLY ABSORBING SUBSTRATES. APPL OPTICS, 34. pp. 7914-7924. ISSN 0003-6935
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| Item Type: | Article |
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| Uncontrolled Keywords: | OPTICAL CONSTANTS THIN FILMS SI REFLECTANCE COATING MATERIALS DIAMOND SILICON SI |
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| Subjects: | UNSPECIFIED |
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| Divisions: | Div B > Electronics, Power & Energy Conversion |
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| Depositing User: | Cron Job |
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| Date Deposited: | 07 Mar 2014 11:54 |
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| Last Modified: | 07 Apr 2014 01:20 |
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| DOI: | |
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