CUED Publications database

Defect gap states on III-V semiconductor-oxide interfaces (invited)

Robertson, J and Lin, L (2011) Defect gap states on III-V semiconductor-oxide interfaces (invited). In: UNSPECIFIED pp. 1440-1443..

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Uncontrolled Keywords: GaAs Oxide Calculation Interface states Passivation FET ATOMIC-LAYER-DEPOSITION SCANNING-TUNNELING-MICROSCOPY FIELD-EFFECT TRANSISTORS COMPOUND SEMICONDUCTORS ELECTRONIC-STRUCTURE GAAS DIELECTRICS PASSIVATION SURFACE STABILITY
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 11:40
Last Modified: 25 Aug 2014 01:12
DOI: 10.1016/j.mee.2011.03.134