CUED Publications database

Defect gap states on III-V semiconductor-oxide interfaces (invited)

Robertson, J and Lin, L (2011) Defect gap states on III-V semiconductor-oxide interfaces (invited). In: UNSPECIFIED pp. 1440-1443..

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Uncontrolled Keywords: GaAs Oxide Calculation Interface states Passivation FET ATOMIC-LAYER-DEPOSITION SCANNING-TUNNELING-MICROSCOPY FIELD-EFFECT TRANSISTORS COMPOUND SEMICONDUCTORS ELECTRONIC-STRUCTURE GAAS DIELECTRICS PASSIVATION SURFACE STABILITY
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 18 May 2016 18:11
Last Modified: 27 Jul 2016 02:37
DOI: 10.1016/j.mee.2011.03.134