Ivry, Y and Chu, DP and Durkan, C (2009) Nanometer resolution piezoresponse force microscopy to study deep submicron ferroelectric and ferroelastic domains. APPL PHYS LETT, 94. -. ISSN 0003-6951
Full text not available from this repository.
| Item Type: | Article |
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| Uncontrolled Keywords: | electric domains ferroelasticity ferroelectric thin films lead compounds scanning probe microscopy THIN-FILMS CERAMICS SCALE |
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| Subjects: | UNSPECIFIED |
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| Divisions: | Div B > Photonics |
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| Depositing User: | Cron Job |
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| Date Deposited: | 31 Oct 2011 08:19 |
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| Last Modified: | 06 May 2013 01:05 |
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| DOI: | 10.1063/1.3105942 |
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