CUED Publications database

Nanometer resolution piezoresponse force microscopy to study deep submicron ferroelectric and ferroelastic domains

Ivry, Y and Chu, DP and Durkan, C (2009) Nanometer resolution piezoresponse force microscopy to study deep submicron ferroelectric and ferroelastic domains. APPL PHYS LETT, 94. -. ISSN 0003-6951

Full text not available from this repository.
Item Type: Article
Uncontrolled Keywords: electric domains ferroelasticity ferroelectric thin films lead compounds scanning probe microscopy THIN-FILMS CERAMICS SCALE
Subjects: UNSPECIFIED
Divisions: Div B > Photonics
Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 09 Dec 2016 17:29
Last Modified: 10 Dec 2016 00:21
DOI: