CUED Publications database

Nanometer resolution piezoresponse force microscopy to study deep submicron ferroelectric and ferroelastic domains

Ivry, Y and Chu, DP and Durkan, C (2009) Nanometer resolution piezoresponse force microscopy to study deep submicron ferroelectric and ferroelastic domains. APPL PHYS LETT, 94. -. ISSN 0003-6951

Full text not available from this repository.
Item Type: Article
Uncontrolled Keywords: electric domains ferroelasticity ferroelectric thin films lead compounds scanning probe microscopy THIN-FILMS CERAMICS SCALE
Subjects: UNSPECIFIED
Divisions: Div B > Photonics
Depositing User: Cron job
Date Deposited: 04 Feb 2015 22:44
Last Modified: 16 Feb 2015 01:25
DOI: 10.1063/1.3105942