CUED Publications database

Nanometer resolution piezoresponse force microscopy to study deep submicron ferroelectric and ferroelastic domains

Ivry, Y and Chu, DP and Durkan, C (2009) Nanometer resolution piezoresponse force microscopy to study deep submicron ferroelectric and ferroelastic domains. APPL PHYS LETT, 94. -. ISSN 0003-6951

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Item Type: Article
Uncontrolled Keywords: electric domains ferroelasticity ferroelectric thin films lead compounds scanning probe microscopy THIN-FILMS CERAMICS SCALE
Subjects: UNSPECIFIED
Divisions: Div B > Photonics
Depositing User: Unnamed user with email sms67@cam.ac.uk
Date Deposited: 16 Jul 2015 13:20
Last Modified: 31 Aug 2015 03:49
DOI: 10.1063/1.3105942