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Simulating scanning ion conductance microscopy using a Monte Carlo approach

Adenle, OA and Fitzgerald, WJ (2006) Simulating scanning ion conductance microscopy using a Monte Carlo approach. SCANNING, 28. pp. 79-80. ISSN 0161-0457

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div F > Signal Processing and Communications
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 11:54
Last Modified: 14 Apr 2014 01:03
DOI:

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