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Simulating scanning ion conductance microscopy using a Monte Carlo approach

Adenle, OA and Fitzgerald, WJ (2006) Simulating scanning ion conductance microscopy using a Monte Carlo approach. SCANNING, 28. pp. 79-80. ISSN 0161-0457

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Item Type: Article
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Date Deposited: 18 May 2016 19:25
Last Modified: 28 Jun 2016 22:50
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