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Simulating scanning ion conductance microscopy using a Monte Carlo approach

Adenle, OA and Fitzgerald, WJ (2006) Simulating scanning ion conductance microscopy using a Monte Carlo approach. SCANNING, 28. pp. 79-80. ISSN 0161-0457

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Item Type: Article
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Depositing User: Unnamed user with email sms67@cam.ac.uk
Date Deposited: 16 Jul 2015 13:52
Last Modified: 31 Jul 2015 00:28
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