Adenle, OA and Fitzgerald, WJ (2006) Simulating scanning ion conductance microscopy using a Monte Carlo approach. SCANNING, 28. pp. 79-80. ISSN 0161-0457
Full text not available from this repository.| Item Type: | Article |
|---|---|
| Subjects: | UNSPECIFIED |
| Divisions: | Div F > Signal Processing and Communications |
| Depositing User: | Cron Job |
| Date Deposited: | 10 Nov 2011 18:10 |
| Last Modified: | 11 Mar 2013 02:00 |
| DOI: |
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