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SCANNING-ELECTRON-BEAM ANNEALING OF ION-IMPLANTED P-N-JUNCTION DIODES

MCMAHON, RA and AHMED, H and SPEIGHT, JD and DOBSON, RM (1979) SCANNING-ELECTRON-BEAM ANNEALING OF ION-IMPLANTED P-N-JUNCTION DIODES. ELECTRON LETT, 15. pp. 433-435. ISSN 0013-5194

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Item Type: Article
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Depositing User: Unnamed user with email sms67@cam.ac.uk
Date Deposited: 16 Jul 2015 13:55
Last Modified: 02 Sep 2015 21:50
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