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A NEW TECHNIQUE FOR DIRECTLY PROBING THE INTRINSIC TRISTABILITY AN DITS TEMPERATURE-DEPENDENCE IN A RESONANT-TUNNELING DIODE

LERCH, MLF and MARTIN, AD and SIMMONDS, PE and EAVES, L and LEADBEATER, ML (1994) A NEW TECHNIQUE FOR DIRECTLY PROBING THE INTRINSIC TRISTABILITY AN DITS TEMPERATURE-DEPENDENCE IN A RESONANT-TUNNELING DIODE. In: UNSPECIFIED pp. 961-964..

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Uncontrolled Keywords: SPACE-CHARGE BUILDUP BISTABILITY
Subjects: UNSPECIFIED
Divisions: UNSPECIFIED
Depositing User: Cron Job
Date Deposited: 17 Jul 2017 19:52
Last Modified: 18 Nov 2017 22:05
DOI: