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TIME-RESOLVED REFLECTIVITY TECHNIQUES FOR DYNAMIC STUDIES OF ELECTRON-BEAM RECRYSTALLIZATION OF SILICON-ON-INSULATOR FILMS

TIMANS, PJ and MCMAHON, RA and AHMED, H (1988) TIME-RESOLVED REFLECTIVITY TECHNIQUES FOR DYNAMIC STUDIES OF ELECTRON-BEAM RECRYSTALLIZATION OF SILICON-ON-INSULATOR FILMS. APPL PHYS LETT, 53. pp. 1844-1846. ISSN 0003-6951

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Electronics, Power & Energy Conversion
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 11:32
Last Modified: 27 Nov 2014 04:51
DOI: