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TIME-RESOLVED REFLECTIVITY TECHNIQUES FOR DYNAMIC STUDIES OF ELECTRON-BEAM RECRYSTALLIZATION OF SILICON-ON-INSULATOR FILMS

TIMANS, PJ and MCMAHON, RA and AHMED, H (1988) TIME-RESOLVED REFLECTIVITY TECHNIQUES FOR DYNAMIC STUDIES OF ELECTRON-BEAM RECRYSTALLIZATION OF SILICON-ON-INSULATOR FILMS. APPL PHYS LETT, 53. pp. 1844-1846. ISSN 0003-6951

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Electronics, Power & Energy Conversion
Depositing User: Unnamed user with email sms67@cam.ac.uk
Date Deposited: 18 May 2016 19:04
Last Modified: 24 May 2016 22:00
DOI: