CUED Publications database

CHARACTERIZATION OF ELECTRONIC AND STRUCTURAL-PROPERTIES OF THIN SILICON DIOXIDE FILMS BY SCANNED PROBE MICROSCOPY

WELLAND, ME and MURRELL, MP (1993) CHARACTERIZATION OF ELECTRONIC AND STRUCTURAL-PROPERTIES OF THIN SILICON DIOXIDE FILMS BY SCANNED PROBE MICROSCOPY. SCANNING, 15. pp. 251-256. ISSN 0161-0457

Full text not available from this repository.
Item Type: Article
Uncontrolled Keywords: SCANNED PROBE MICROSCOPY SILICON DIOXIDE BREAKDOWN STRENGTH
Subjects: UNSPECIFIED
Divisions: UNSPECIFIED
Depositing User: Cron job
Date Deposited: 04 Feb 2015 22:09
Last Modified: 01 May 2015 19:09
DOI: