WELLAND, ME and MURRELL, MP (1993) CHARACTERIZATION OF ELECTRONIC AND STRUCTURAL-PROPERTIES OF THIN SILICON DIOXIDE FILMS BY SCANNED PROBE MICROSCOPY. SCANNING, 15. pp. 251-256. ISSN 0161-0457
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| Item Type: | Article |
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| Uncontrolled Keywords: | SCANNED PROBE MICROSCOPY SILICON DIOXIDE BREAKDOWN STRENGTH |
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| Subjects: | UNSPECIFIED |
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| Divisions: | UNSPECIFIED |
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| Depositing User: | Cron Job |
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| Date Deposited: | 04 Nov 2011 15:54 |
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| Last Modified: | 20 May 2013 01:33 |
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| DOI: | |
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