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CHARACTERIZATION OF ELECTRONIC AND STRUCTURAL-PROPERTIES OF THIN SILICON DIOXIDE FILMS BY SCANNED PROBE MICROSCOPY

WELLAND, ME and MURRELL, MP (1993) CHARACTERIZATION OF ELECTRONIC AND STRUCTURAL-PROPERTIES OF THIN SILICON DIOXIDE FILMS BY SCANNED PROBE MICROSCOPY. SCANNING, 15. pp. 251-256. ISSN 0161-0457

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Item Type: Article
Uncontrolled Keywords: SCANNED PROBE MICROSCOPY SILICON DIOXIDE BREAKDOWN STRENGTH
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 11:43
Last Modified: 17 Mar 2014 14:50
DOI: