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Single shot measurement of the lifetime of a trapped electron in the gate dielectric of a high-k field effect transistor

Khan, MZR and Hasko, DG and Saifullah, MSM and Welland, ME (2008) Single shot measurement of the lifetime of a trapped electron in the gate dielectric of a high-k field effect transistor. APPL PHYS LETT, 93. -. ISSN 0003-6951

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Item Type: Article
Uncontrolled Keywords: dielectric materials electron traps field effect transistors Q-factor titanium compounds QUANTUM-DOT SPIN
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 11:32
Last Modified: 20 Aug 2014 20:46
DOI: 10.1063/1.3013576

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