CUED Publications database

Single shot measurement of the lifetime of a trapped electron in the gate dielectric of a high-k field effect transistor

Khan, MZR and Hasko, DG and Saifullah, MSM and Welland, ME (2008) Single shot measurement of the lifetime of a trapped electron in the gate dielectric of a high-k field effect transistor. APPL PHYS LETT, 93. -. ISSN 0003-6951

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Item Type: Article
Uncontrolled Keywords: dielectric materials electron traps field effect transistors Q-factor titanium compounds QUANTUM-DOT SPIN
Subjects: UNSPECIFIED
Divisions: UNSPECIFIED
Depositing User: Cron job
Date Deposited: 04 Feb 2015 22:23
Last Modified: 05 Feb 2015 00:32
DOI: 10.1063/1.3013576