Khan, MZR and Hasko, DG and Saifullah, MSM and Welland, ME (2008) Single shot measurement of the lifetime of a trapped electron in the gate dielectric of a high-k field effect transistor. APPL PHYS LETT, 93. -. ISSN 0003-6951
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|Item Type: ||Article|
|Uncontrolled Keywords: ||dielectric materials electron traps field effect transistors Q-factor titanium compounds QUANTUM-DOT SPIN|
|Depositing User: ||Cron Job|
|Date Deposited: ||04 Nov 2011 15:54|
|Last Modified: ||27 May 2013 01:19|
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