CUED Publications database

Characterization of a sol-gel based high-k dielectric field effect transistor for cryogenic operation

Khan, MZR and Hasko, DG and Saifullah, MSM and Welland, ME (2008) Characterization of a sol-gel based high-k dielectric field effect transistor for cryogenic operation. J VAC SCI TECHNOL B, 26. pp. 1887-1891. ISSN 1071-1023

Full text not available from this repository.
Item Type: Article
Uncontrolled Keywords: high-k dielectric thin films insulated gate field effect transistors leakage currents Poole-Frenkel effect silicon-on-insulator sol-gel processing MICROWAVE IRRADIATION ELECTRON
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 11:32
Last Modified: 08 Dec 2014 02:39
DOI: 10.1116/1.3006019