Khan, MZR and Hasko, DG and Saifullah, MSM and Welland, ME (2008) Characterization of a sol-gel based high-k dielectric field effect transistor for cryogenic operation. J VAC SCI TECHNOL B, 26. pp. 1887-1891. ISSN 1071-1023
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|Item Type: ||Article|
|Uncontrolled Keywords: ||high-k dielectric thin films insulated gate field effect transistors leakage currents Poole-Frenkel effect silicon-on-insulator sol-gel processing MICROWAVE IRRADIATION ELECTRON|
|Depositing User: ||Cron Job|
|Date Deposited: ||04 Nov 2011 15:54|
|Last Modified: ||18 Nov 2013 01:12|
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