Khan, MZR and Hasko, DG and Saifullah, MSM and Welland, ME (2008) Characterization of a sol-gel based high-k dielectric field effect transistor for cryogenic operation. J VAC SCI TECHNOL B, 26. pp. 1887-1891. ISSN 1071-1023
Full text not available from this repository.
| Item Type: | Article |
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| Uncontrolled Keywords: | high-k dielectric thin films insulated gate field effect transistors leakage currents Poole-Frenkel effect silicon-on-insulator sol-gel processing MICROWAVE IRRADIATION ELECTRON |
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| Subjects: | UNSPECIFIED |
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| Divisions: | UNSPECIFIED |
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| Depositing User: | Cron Job |
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| Date Deposited: | 04 Nov 2011 15:54 |
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| Last Modified: | 20 May 2013 01:38 |
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| DOI: | 10.1116/1.3006019 |
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