Robertson, J and Xiong, K (2006) Defect energy levels in MO2. In: UNSPECIFIED pp. 175-179..
Full text not available from this repository.
| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
|---|
| Uncontrolled Keywords: | IWNC nano CMOS GATE DIELECTRIC STACKS THRESHOLD VOLTAGE INSTABILITIES BAND OFFSETS HFO2 RESONANCE CENTERS SYSTEM FILMS GAPS |
|---|
| Subjects: | UNSPECIFIED |
|---|
| Divisions: | UNSPECIFIED |
|---|
| Depositing User: | Cron Job |
|---|
| Date Deposited: | 19 Jan 2012 10:12 |
|---|
| Last Modified: | 20 May 2013 01:38 |
|---|
| DOI: | |
|---|
Actions (login required)
