CUED Publications database

Electronic defects in LaAlO3

Xiong, K and Robertson, J and Clark, SJ (2008) Electronic defects in LaAlO3. In: UNSPECIFIED pp. 65-69..

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Uncontrolled Keywords: gate oxide defects trapping calculation DIELECTRIC-CONSTANT OXIDES ATOMIC LAYER DEPOSITION GATE DIELECTRICS AMORPHOUS LAALO3 BAND OFFSETS DENSITY APPROXIMATION ELECTRICAL-PROPERTIES FILMS SI(001) SILICON
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 11:32
Last Modified: 02 Jun 2014 01:14
DOI: 10.1016/j.mee.2007.01.181

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