CUED Publications database

Electronic defects in LaAlO3

Xiong, K and Robertson, J and Clark, SJ (2008) Electronic defects in LaAlO3. In: UNSPECIFIED pp. 65-69..

Full text not available from this repository.
Item Type: Conference or Workshop Item (UNSPECIFIED)
Uncontrolled Keywords: gate oxide defects trapping calculation DIELECTRIC-CONSTANT OXIDES ATOMIC LAYER DEPOSITION GATE DIELECTRICS AMORPHOUS LAALO3 BAND OFFSETS DENSITY APPROXIMATION ELECTRICAL-PROPERTIES FILMS SI(001) SILICON
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 18 May 2016 18:25
Last Modified: 24 May 2016 23:33
DOI: 10.1016/j.mee.2007.01.181