CUED Publications database

Polarization effects in reflection-mode scanning near-field optical microscopy

Durkan, C and Shvets, IV (1998) Polarization effects in reflection-mode scanning near-field optical microscopy. J APPL PHYS, 83. pp. 1837-1843. ISSN 0021-8979

Full text not available from this repository.
Item Type: Article
Uncontrolled Keywords: SHEAR-FORCE CONTRAST SCALE
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 11:32
Last Modified: 21 Dec 2014 03:45
DOI: