Durkan, C and Shvets, IV (1998) Polarization effects in reflection-mode scanning near-field optical microscopy. J APPL PHYS, 83. pp. 1837-1843. ISSN 0021-8979
Full text not available from this repository.| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | SHEAR-FORCE CONTRAST SCALE |
| Subjects: | UNSPECIFIED |
| Divisions: | UNSPECIFIED |
| Depositing User: | Cron Job |
| Date Deposited: | 07 Nov 2011 16:56 |
| Last Modified: | 27 May 2013 01:19 |
| DOI: |
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