CUED Publications database

Polarization effects in reflection-mode scanning near-field optical microscopy

Durkan, C and Shvets, IV (1998) Polarization effects in reflection-mode scanning near-field optical microscopy. J APPL PHYS, 83. pp. 1837-1843. ISSN 0021-8979

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Item Type: Article
Uncontrolled Keywords: SHEAR-FORCE CONTRAST SCALE
Subjects: UNSPECIFIED
Divisions: UNSPECIFIED
Depositing User: Cron job
Date Deposited: 16 Jul 2015 13:47
Last Modified: 31 Aug 2015 09:55
DOI: