Flewitt, AJ and Lin, S and Milne, WI and Wehrspohn, RB and Powell, MJ (2006) Mechanisms for defect creation and removal in hydrogenated and deuterated amorphous silicon studied using thin film transistors. In: Symposium A: Amorphous and Nanocrystalline Silicon-Based Films--2006, 17-4-2006 to 21-4-2006, San Francisco, CA, US pp. 449-460..
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| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
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| Additional Information: | Id number = Paper No: 0910-A19-01 Event type = other |
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| Uncontrolled Keywords: | IMPROVED STABILITY DIFFUSION METASTABILITY ALLOY MODEL SI |
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| Subjects: | UNSPECIFIED |
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| Divisions: | UNSPECIFIED |
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| Depositing User: | Cron Job |
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| Date Deposited: | 20 Dec 2011 12:10 |
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| Last Modified: | 11 Mar 2013 02:01 |
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| DOI: | |
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