Flewitt, AJ and Lin, S and Milne, WI and Wehrspohn, RB and Powell, MJ (2007) Mechanisms for defect creation and removal in hydrogenated and deuterated amorphous silicon studied using thin film transistors. In: UNSPECIFIED pp. 449-460..
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|Item Type: ||Conference or Workshop Item (UNSPECIFIED)|
|Uncontrolled Keywords: ||IMPROVED STABILITY DIFFUSION METASTABILITY ALLOY MODEL SI|
|Divisions: ||Div B > Solid State Electronics and Nanoscale Science|
|Depositing User: ||Cron Job|
|Date Deposited: ||07 Mar 2014 11:54|
|Last Modified: ||06 Oct 2014 01:24|
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