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SCANNING ION MICROSCOPY AND MICROSECTIONING OF ELECTRON-BEAM RECRYSTALLIZED SILICON ON INSULATOR DEVICES

KIRK, ECG and MCMAHON, RA and CLEAVER, JRA and AHMED, H (1988) SCANNING ION MICROSCOPY AND MICROSECTIONING OF ELECTRON-BEAM RECRYSTALLIZED SILICON ON INSULATOR DEVICES. J VAC SCI TECHNOL B, 6. pp. 1940-1943. ISSN 1071-1023

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Item Type: Article
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Depositing User: Cron job
Date Deposited: 16 Jul 2015 13:49
Last Modified: 31 Aug 2015 08:09
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