GERBER, J and SATTEL, S and JUNG, K and EHRHARDT, H and ROBERTSON, J (1995) EXPERIMENTAL CHARACTERIZATION OF BIAS-ENHANCED NUCLEATION OF DIAMOND ON SI. In: UNSPECIFIED pp. 559-562..
Full text not available from this repository.Item Type: | Conference or Workshop Item (UNSPECIFIED) |
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Uncontrolled Keywords: | DIAMOND NUCLEATION DC BIAS MEASUREMENT ION BOMBARDMENT CHARACTERIZATION SILICON |
Subjects: | UNSPECIFIED |
Divisions: | Div B > Solid State Electronics and Nanoscale Science |
Depositing User: | Cron Job |
Date Deposited: | 17 Jul 2017 20:06 |
Last Modified: | 17 Apr 2018 03:14 |
DOI: |