GERBER, J and SATTEL, S and JUNG, K and EHRHARDT, H and ROBERTSON, J (1995) EXPERIMENTAL CHARACTERIZATION OF BIAS-ENHANCED NUCLEATION OF DIAMOND ON SI. In: UNSPECIFIED pp. 559-562..
Full text not available from this repository.| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
|---|---|
| Uncontrolled Keywords: | DIAMOND NUCLEATION DC BIAS MEASUREMENT ION BOMBARDMENT CHARACTERIZATION SILICON |
| Subjects: | UNSPECIFIED |
| Divisions: | Div B > Solid State Electronics and Nanoscale Science |
| Depositing User: | Cron Job |
| Date Deposited: | 17 Jul 2017 20:06 |
| Last Modified: | 18 Jul 2017 10:50 |
| DOI: |
