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EXPERIMENTAL CHARACTERIZATION OF BIAS-ENHANCED NUCLEATION OF DIAMOND ON SI

GERBER, J and SATTEL, S and JUNG, K and EHRHARDT, H and ROBERTSON, J (1995) EXPERIMENTAL CHARACTERIZATION OF BIAS-ENHANCED NUCLEATION OF DIAMOND ON SI. In: UNSPECIFIED pp. 559-562..

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Uncontrolled Keywords: DIAMOND NUCLEATION DC BIAS MEASUREMENT ION BOMBARDMENT CHARACTERIZATION SILICON
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 11:31
Last Modified: 17 Mar 2014 15:02
DOI:

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