CUED Publications database

Towards Achieving the Soft-Punch-Through Superjunction Insulated-Gate Bipolar Transistor Breakdown Capability

Antoniou, M and Udrea, F and Bauer, F and Mihaila, A and Nistor, I (2011) Towards Achieving the Soft-Punch-Through Superjunction Insulated-Gate Bipolar Transistor Breakdown Capability. IEEE ELECTR DEVICE L, 32. pp. 1275-1277. ISSN 0741-3106

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Item Type: Article
Uncontrolled Keywords: Insulated Gate Bipolar Transistor (IGBT) superjunction (SJ) termination
Subjects: UNSPECIFIED
Divisions: UNSPECIFIED
Depositing User: Cron job
Date Deposited: 04 Feb 2015 22:26
Last Modified: 01 May 2015 19:06
DOI: 10.1109/LED.2011.2160930