SMITH, DA and MCMAHON, RA and AHMED, H and BARFOOT, KM and PETERS, TB and HOPPER, GF and GODFREY, DJ (1988) SCANNING ELECTRON-MICROSCOPY STUDY OF SEEDED RECRYSTALLIZATION OF SILICON-ON-INSULATOR LAYERS WITH EITHER POLYCRYSTALLINE OR EPITAXIALLY DEPOSITED SILICON IN THE SEED WINDOWS. J APPL PHYS, 63. pp. 1438-1441. ISSN 0021-8979
Full text not available from this repository.| Item Type: | Article |
|---|---|
| Subjects: | UNSPECIFIED |
| Divisions: | Div B > Electronics, Power & Energy Conversion |
| Depositing User: | Cron Job |
| Date Deposited: | 11 Nov 2011 10:24 |
| Last Modified: | 27 May 2013 01:19 |
| DOI: |
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