Warren, WL and Seager, CH and Robertson, J and Kanicki, J and Poindexter, EH (1996) Creation and properties of nitrogen dangling bond defects in silicon nitride thin films. J ELECTROCHEM SOC, 143. pp. 3685-3691. ISSN 0013-4651
Full text not available from this repository.
| Item Type: | Article |
|---|
| Uncontrolled Keywords: | HYDROGENATED AMORPHOUS-SILICON INDUCED PARAMAGNETIC DEFECTS ELECTRON-SPIN-RESONANCE SI-N FILMS SLOW PROCESSES MODEL CENTERS ENERGY |
|---|
| Subjects: | UNSPECIFIED |
|---|
| Divisions: | UNSPECIFIED |
|---|
| Depositing User: | Cron Job |
|---|
| Date Deposited: | 19 Jan 2012 10:12 |
|---|
| Last Modified: | 11 Mar 2013 02:01 |
|---|
| DOI: | |
|---|
Actions (login required)
