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Work function control at metal-oxide interfaces in CMOS

Tse, K and Robertson, J (2006) Work function control at metal-oxide interfaces in CMOS. In: UNSPECIFIED pp. 964-968..

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Uncontrolled Keywords: interfaces gate oxides metal gate electrodes calculation BAND OFFSETS GATE STABILITY SILICON
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Unnamed user with email sms67@cam.ac.uk
Date Deposited: 18 May 2016 18:24
Last Modified: 28 Jul 2016 03:05
DOI: 10.1016/j.mssp.2006.10.039