CUED Publications database

Exploration of power device reliability using compact device models and fast electrothermal simulation

Bryant, AT and Mawby, PA and Palmer, PR and Santi, E and Hudgins, JL (2008) Exploration of power device reliability using compact device models and fast electrothermal simulation. IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS, 44. pp. 894-903. ISSN 0093-9994

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Item Type: Article
Uncontrolled Keywords: compact modeling electrothermal simulation mission profile power semiconductor devices rainflow cycle counting reliability thermal cycling GATE BIPOLAR-TRANSISTOR IGBT MODULES LIFETIME PREDICTION DIODE OPTIMIZATION EXTRACTION SYSTEMS STRESS DESIGN
Subjects: UNSPECIFIED
Divisions: UNSPECIFIED
Depositing User: Cron job
Date Deposited: 04 Feb 2015 22:04
Last Modified: 05 Feb 2015 10:37
DOI: 10.1109/TIA.2008.921388