Bryant, AT and Mawby, PA and Palmer, PR and Santi, E and Hudgins, JL (2008) Exploration of power device reliability using compact device models and fast electrothermal simulation. IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS, 44. pp. 894-903. ISSN 0093-9994
Full text not available from this repository.
| Item Type: | Article |
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| Uncontrolled Keywords: | compact modeling electrothermal simulation mission profile power semiconductor devices rainflow cycle counting reliability thermal cycling GATE BIPOLAR-TRANSISTOR IGBT MODULES LIFETIME PREDICTION DIODE OPTIMIZATION EXTRACTION SYSTEMS STRESS DESIGN |
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| Subjects: | UNSPECIFIED |
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| Divisions: | Div B > Electronics, Power & Energy Conversion |
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| Depositing User: | Cron Job |
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| Date Deposited: | 28 Oct 2011 16:37 |
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| Last Modified: | 20 May 2013 01:30 |
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| DOI: | 10.1109/TIA.2008.921388 |
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