Xiong, K and Delugas, P and Hooker, JC and Fiorentini, V and Robertson, J and Liu, DM and Pourtois, G (2008) Te-induced modulation of the Mo/HfO2 interface effective work function. APPL PHYS LETT, 92. -. ISSN 0003-6951
Full text not available from this repository.
| Item Type: | Article |
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| Uncontrolled Keywords: | GATE OXIDES METAL TECHNOLOGY STABILITY DEVICES |
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| Subjects: | UNSPECIFIED |
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| Divisions: | UNSPECIFIED |
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| Depositing User: | Cron Job |
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| Date Deposited: | 19 Jan 2012 10:12 |
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| Last Modified: | 06 May 2013 01:04 |
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| DOI: | 10.1063/1.2870078 |
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