Xiong, K and Delugas, P and Hooker, JC and Fiorentini, V and Robertson, J and Liu, DM and Pourtois, G (2008) Te-induced modulation of the Mo/HfO2 interface effective work function. APPL PHYS LETT, 92. -. ISSN 0003-6951
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|Item Type: ||Article|
|Uncontrolled Keywords: ||GATE OXIDES METAL TECHNOLOGY STABILITY DEVICES|
|Depositing User: ||Cron Job|
|Date Deposited: ||19 Jan 2012 10:12|
|Last Modified: ||06 May 2013 01:04|
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