CUED Publications database

Stress relaxation in thin film/substrate systems by grain boundary diffusion: a discrete dislocation framework

Ayas, C and Van der Giessen, E (2009) Stress relaxation in thin film/substrate systems by grain boundary diffusion: a discrete dislocation framework. In: UNSPECIFIED -..

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Uncontrolled Keywords: FILMS PLASTICITY WEDGES CREEP
Subjects: UNSPECIFIED
Divisions: Div C > Applied Mechanics
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 11:31
Last Modified: 28 Nov 2014 19:05
DOI: 10.1088/0965-0393/17/6/064007