CUED Publications database

Stress relaxation in thin film/substrate systems by grain boundary diffusion: a discrete dislocation framework

Ayas, C and Van der Giessen, E (2009) Stress relaxation in thin film/substrate systems by grain boundary diffusion: a discrete dislocation framework. In: UNSPECIFIED -..

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Uncontrolled Keywords: FILMS PLASTICITY WEDGES CREEP
Subjects: UNSPECIFIED
Divisions: Div C > Applied Mechanics
Depositing User: Unnamed user with email sms67@cam.ac.uk
Date Deposited: 02 Sep 2016 16:39
Last Modified: 25 Sep 2016 01:54
DOI: