Durkan, C and Chu, DP and Ivry, Y (2010) Response to "Comment on 'Nanometer resolution piezoreponse force microscopy to study deep submicron ferroelectric and ferroelastic domains' " [Appl. Phys. Lett. 97, 046101 (2010)]. APPL PHYS LETT, 97. -. ISSN 0003-6951
Full text not available from this repository.Item Type: | Article |
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Uncontrolled Keywords: | electric domains ferroelasticity lead compounds piezoelectricity sol-gel processing |
Subjects: | UNSPECIFIED |
Divisions: | Div B > Photonics Div B > Solid State Electronics and Nanoscale Science |
Depositing User: | Cron Job |
Date Deposited: | 17 Jul 2017 19:47 |
Last Modified: | 18 Feb 2021 15:41 |
DOI: | 10.1063/1.3467006 |