CUED Publications database

Influence of lattice temperature on SOI MOSFET's output characteristics

Chen, Y and Ekkanath Madathil, SN and Clough, FJ and Milne, WI (1995) Influence of lattice temperature on SOI MOSFET's output characteristics. IEE Colloquium (Digest). 8/1-8/4. ISSN 0963-3308

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Abstract

An explanation for the observed variations in the output behaviour of SOI transistors with different buried oxide thicknesses is presented. At low drain bias, the temperature effects are relatively insignificant while at high drain bias, the temperature effects dominate the nonlinear behaviour of the output characteristics.

Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 11:59
Last Modified: 27 Nov 2014 19:24
DOI: