CUED Publications database

Mode control in vertical-cavity surface-emitting lasers by post-processing using focused ion-beaih etching

Dowd, P and Raddatz, L and Sumaila, Y and Asghari, M and White, IH and Penty, RV and Heard, PJ and Allen, GC and Schneider, RP and Tan, MRT and Wang, SY (1997) Mode control in vertical-cavity surface-emitting lasers by post-processing using focused ion-beaih etching. IEEE Photonics Technology Letters, 9. pp. 1193-1195. ISSN 1041-1135

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Abstract

Single-mode emission is achieved in previously multimode gain-guided vertical-cavity surface-emitting lasers (VCSEL's) by localized modification of the mirror reflectivity using focused ion-beam etching. Reflectivity engineering is also demonstrated to suppress transverse mode emission in an oxide-confined device, reducing the spectral width from 1.2 nm to less than 0.5 nm.

Item Type: Article
Uncontrolled Keywords: Focused ion-beam etching Reflectivity engineering Transverse mode control Vertical-cavity surface-emitting lasers
Subjects: UNSPECIFIED
Divisions: Div B > Photonics
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 11:31
Last Modified: 27 Nov 2014 19:23
DOI: 10.1109/68.618474