Dowd, P and Raddatz, L and Sumaila, Y and Asghari, M and White, IH and White, IH and Penty, RV and Heard, PJ and Allen, GC and Schneider, RP and Tan, MRT and Wang, SY (1997) Mode control in vertical-cavity surface-emitting lasers by post-processing using focused ion-beaih etching. IEEE Photonics Technology Letters, 9. pp. 1193-1195. ISSN 1041-1135Full text not available from this repository.
Single-mode emission is achieved in previously multimode gain-guided vertical-cavity surface-emitting lasers (VCSEL's) by localized modification of the mirror reflectivity using focused ion-beam etching. Reflectivity engineering is also demonstrated to suppress transverse mode emission in an oxide-confined device, reducing the spectral width from 1.2 nm to less than 0.5 nm.
|Uncontrolled Keywords:||Focused ion-beam etching Reflectivity engineering Transverse mode control Vertical-cavity surface-emitting lasers|
|Divisions:||Div B > Photonics|
|Depositing User:||Unnamed user with email firstname.lastname@example.org|
|Date Deposited:||16 Jul 2015 14:14|
|Last Modified:||03 Sep 2015 06:00|