Sargent, LJ and Kuball, M and Rorison, JM and Penty, RV and White, IH and Heard, PJ and Tan, MRT and Wang, SY (1998) Mechanism of polarization pinning in vertical cavity surface emitting lasers using focused ion beam etching. Conference Digest - IEEE International Semiconductor Laser Conference. pp. 119-120. ISSN 0899-9406Full text not available from this repository.
Photoluminescence experiments have identified strain as the origin for polarization pinning in vertical cavity surface emitting lasers post-processed by focused ion beam etching. Theoretical models were applied to deduce the strain in devices. Post-annealing was used to optimize polarization pinning.
|Divisions:||Div B > Photonics|
|Depositing User:||Cron job|
|Date Deposited:||16 Jul 2015 14:14|
|Last Modified:||29 Nov 2015 09:44|