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Characterization of defect removal in hydrogenated and deuterated amorphous silicon thin film transistors

Flewitt, AJ and Lin, S and Milne, WI and Wehrspohn, RB and Powell, MJ (2006) Characterization of defect removal in hydrogenated and deuterated amorphous silicon thin film transistors. Journal of Non-Crystalline Solids, 352. pp. 1700-1703. ISSN 0022-3093

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 11:21
Last Modified: 19 May 2014 01:12
DOI:

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