Luo, JK and Fu, YQ and Huang, QA and Williams, JA and Milne, WI (2008) Degradation evaluation of microelectromechanical thermal actuators. Proceedings of SPIE - The International Society for Optical Engineering, 6884. ISSN 0277-786X
Full text not available from this repository.| Item Type: | Article |
|---|---|
| Subjects: | UNSPECIFIED |
| Divisions: | Div C > Materials Engineering |
| Depositing User: | Cron Job |
| Date Deposited: | 13 Dec 2011 13:10 |
| Last Modified: | 20 May 2013 01:41 |
| DOI: |
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