Adenle, OA and Fitzgerald, WJ (2009) On the relationship between hidden Markov Models and convex functional transforms for simulating scanning probe Microscopy. Proceedings of SPIE - The International Society for Optical Engineering, 7378. ISSN 0277-786XFull text not available from this repository.
Models for simulating Scanning Probe Microscopy (SPM) may serve as a reference point for validating experimental data and practice. Generally, simulations use a microscopic model of the sample-probe interaction based on a first-principles approach, or a geometric model of macroscopic distortions due to the probe geometry. Examples of the latter include use of neural networks, the Legendre Transform, and dilation/erosion transforms from mathematical morphology. Dilation and the Legendre Transform fall within a general family of functional transforms, which distort a function by imposing a convex solution.In earlier work, the authors proposed a generalized approach to modeling SPM using a hidden Markov model, wherein both the sample-probe interaction and probe geometry may be taken into account. We present a discussion of the hidden Markov model and its relationship to these convex functional transforms for simulating and restoring SPM images.©2009 SPIE.
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|Date Deposited:||02 Sep 2016 18:21|
|Last Modified:||22 Oct 2016 04:09|