CUED Publications database

On the relationship between hidden Markov Models and convex functional transforms for simulating scanning probe Microscopy

Adenle, OA and Fitzgerald, WJ (2009) On the relationship between hidden Markov Models and convex functional transforms for simulating scanning probe Microscopy. Proceedings of SPIE - The International Society for Optical Engineering, 7378. ISSN 0277-786X

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Abstract

Models for simulating Scanning Probe Microscopy (SPM) may serve as a reference point for validating experimental data and practice. Generally, simulations use a microscopic model of the sample-probe interaction based on a first-principles approach, or a geometric model of macroscopic distortions due to the probe geometry. Examples of the latter include use of neural networks, the Legendre Transform, and dilation/erosion transforms from mathematical morphology. Dilation and the Legendre Transform fall within a general family of functional transforms, which distort a function by imposing a convex solution.In earlier work, the authors proposed a generalized approach to modeling SPM using a hidden Markov model, wherein both the sample-probe interaction and probe geometry may be taken into account. We present a discussion of the hidden Markov model and its relationship to these convex functional transforms for simulating and restoring SPM images.©2009 SPIE.

Item Type: Article
Uncontrolled Keywords: Hidden Markov Models Legendre Transform Scanning Probe Microscopy Simulation
Subjects: UNSPECIFIED
Divisions: Div F > Signal Processing and Communications
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 12:46
Last Modified: 27 Nov 2014 19:20
DOI: 10.1117/12.824187