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Characterization of nano-composite M-2411/Y-123 thin films by electron backscatter diffraction and in-field critical current measurements

Bodea, MA and Pedarnig, JD and Withnell, TD and Weber, HW and Cardwell, DA and Hari Babu, N and Koblischka-Veneva, A (2010) Characterization of nano-composite M-2411/Y-123 thin films by electron backscatter diffraction and in-field critical current measurements. Journal of Physics: Conference Series, 234. ISSN 1742-6588

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Abstract

Thin films of nano-composite Y-Ba-Cu-O (YBCO) superconductors containing nano-sized, non-superconducting particles of Y 2Ba 4CuMO x (M-2411 with M = Ag and Nb) have been prepared by the PLD technique. Electron backscatter diffraction (EBSD) has been used to analyze the crystallographic orientation of nano-particles embedded in the film microstructure. The superconducting YBa 2Cu 3O 7 (Y-123) phase matrix is textured with a dominant (001) orientation for all samples, whereas the M-2411 phase exhibits a random orientation. Angular critical current measurements at various temperature (T) and applied magnetic field (B) have been performed on thin films containing different concentration of the M-2411 second phase. An increase in critical current density J c at T < 77 K and B < 6 T is observed for samples with low concentration of the second phase (2 mol % M-2411). Films containing 5 mol % Ag-2411 exhibit lower J c than pure Y-123 thin films at all fields and temperatures. Samples with 5 mol % Nb-2411 show higher J c(B) than phase pure Y-123 thin films for T < 77 K. © 2010 IOP Publishing Ltd.

Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div C > Materials Engineering
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 12:27
Last Modified: 08 Dec 2014 02:37
DOI: 10.1088/1742-6596/234/1/012006