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Characterization of nano-composite M-2411/Y-123 thin films by electron backscatter diffraction and in-field critical current measurements

Bodea, MA and Pedarnig, JD and Withnell, TD and Weber, HW and Cardwell, DA and Hari Babu, N and Koblischka-Veneva, A (2010) Characterization of nano-composite M-2411/Y-123 thin films by electron backscatter diffraction and in-field critical current measurements. Journal of Physics: Conference Series, 234. ISSN 1742-6588

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div C > Materials Engineering
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 12:27
Last Modified: 10 Mar 2014 17:49
DOI:

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