Bodea, MA and Pedarnig, JD and Withnell, TD and Weber, HW and Cardwell, DA and Hari Babu, N and Koblischka-Veneva, A (2010) Characterization of nano-composite M-2411/Y-123 thin films by electron backscatter diffraction and in-field critical current measurements. Journal of Physics: Conference Series, 234. ISSN 1742-6588
Full text not available from this repository.| Item Type: | Article |
|---|---|
| Subjects: | UNSPECIFIED |
| Divisions: | Div C > Materials Engineering |
| Depositing User: | Cron Job |
| Date Deposited: | 28 Oct 2011 16:36 |
| Last Modified: | 22 Oct 2012 01:12 |
| DOI: |
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