Bodea, MA and Pedarnig, JD and Withnell, TD and Weber, HW and Cardwell, DA and Hari Babu, N and Koblischka-Veneva, A (2010) Characterization of nano-composite M-2411/Y-123 thin films by electron backscatter diffraction and in-field critical current measurements. Journal of Physics: Conference Series, 234. ISSN 1742-6588Full text not available from this repository.
|Divisions:||Div C > Materials Engineering|
|Depositing User:||Cron Job|
|Date Deposited:||28 Oct 2011 16:36|
|Last Modified:||22 Oct 2012 01:12|
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