Kim, TK and Kittler, J and KIM, HC and Kee, SC (2003) Discriminant analysis by multiple locally linear transformations. In: British Machine Vision Conference (BMVC), 8-9-2003 to 11-9-2003, Norwich, UK.
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| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
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| Additional Information: | Event type = conference Proceedings of the British machine vision conference held at Norwich, UK; Sep 2003 Conference item published as a book section. |
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| Subjects: | UNSPECIFIED |
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| Divisions: | Div F > Machine Intelligence |
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| Depositing User: | Cron Job |
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| Date Deposited: | 28 Oct 2011 16:39 |
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| Last Modified: | 15 Nov 2011 10:24 |
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| DOI: | |
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