Kim, TK and Kim, H and Hwang, W and Kee, SC and Kittler, J (2003) Independent component analysis in a facial local residue space. In: 22nd IEEE Computer Society Conference on Computer Vision and Pattern Recognition (CVPR), 16-6-2003 to 22-6-2003, Madison, WI, USA pp. 579-586..
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|Item Type: ||Conference or Workshop Item (UNSPECIFIED)|
|Additional Information: ||Event type = conference ISSN: 1063-6919|
|Divisions: ||Div F > Machine Intelligence|
|Depositing User: ||Cron Job|
|Date Deposited: ||28 Oct 2011 16:39|
|Last Modified: ||15 Nov 2011 10:24|
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