Kim, TK and Kim, H and Hwang, W and Kee, SC and Kittler, J (2003) Independent component analysis in a facial local residue space. In: 22nd IEEE Computer Society Conference on Computer Vision and Pattern Recognition (CVPR), 16-6-2003 to 22-6-2003, Madison, WI, USA pp. 579-586..
Full text not available from this repository.
| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
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| Additional Information: | Event type = conference ISSN: 1063-6919 |
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| Subjects: | UNSPECIFIED |
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| Divisions: | Div F > Machine Intelligence |
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| Depositing User: | Cron Job |
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| Date Deposited: | 28 Oct 2011 16:39 |
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| Last Modified: | 15 Nov 2011 10:24 |
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| DOI: | |
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