Yan, H and El Gomati, MM and Prutton, M and Wilkinson, DK and Chu, DP and Dowsett, MG (1998) Mc3D: A three-dimensional Monte Carlo system simulating image contrast in surface analytical scanning electron microscopy - I - Object-oriented software design and tests. SCANNING, 20. pp. 465-484. ISSN 0161-0457
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| Item Type: | Article |
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| Uncontrolled Keywords: | Monte Carlo simulation scanning electron microscope Auger DEPTH DISTRIBUTION FUNCTION MEAN FREE PATHS AUGER MICROSCOPY 50-2000-EV RANGE CROSS-SECTIONS SCATTERING TARGETS PROGRAM |
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| Subjects: | UNSPECIFIED |
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| Divisions: | Div B > Photonics |
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| Depositing User: | Cron Job |
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| Date Deposited: | 10 Nov 2011 10:10 |
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| Last Modified: | 03 Jun 2013 01:12 |
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| DOI: | |
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