Dowsett, MG and Chu, DP (1998) Quantification of secondary-ion-mass spectroscopy depth profiles using maximum entropy deconvolution with a sample independent response function. In: UNSPECIFIED pp. 377-381..
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| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
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| Uncontrolled Keywords: | SPECTROMETRY LAYERS NOISE |
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| Subjects: | UNSPECIFIED |
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| Divisions: | Div B > Photonics |
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| Depositing User: | Cron Job |
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| Date Deposited: | 10 Nov 2011 10:10 |
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| Last Modified: | 03 Jun 2013 01:12 |
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| DOI: | |
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