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Quantification of secondary-ion-mass spectroscopy depth profiles using maximum entropy deconvolution with a sample independent response function

Dowsett, MG and Chu, DP (1998) Quantification of secondary-ion-mass spectroscopy depth profiles using maximum entropy deconvolution with a sample independent response function. In: UNSPECIFIED pp. 377-381..

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Uncontrolled Keywords: SPECTROMETRY LAYERS NOISE
Subjects: UNSPECIFIED
Divisions: Div B > Photonics
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 11:30
Last Modified: 20 Oct 2014 01:09
DOI:

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