CUED Publications database

Investigation into IGBT dV/dt during turn-off and its temperature dependence

Bryant, A and Yang, S and Mawby, P and Xiang, D and Ran, L and Tavner, P and Palmer, PR (2011) Investigation into IGBT dV/dt during turn-off and its temperature dependence. IEEE Transactions on Power Electronics, 26. pp. 3019-3031. ISSN 0885-8993

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Abstract

In many power converter applications, particularly those with high variable loads, such as traction and wind power, condition monitoring of the power semiconductor devices in the converter is considered desirable. Monitoring the device junction temperature in such converters is an essential part of this process. In this paper, a method for measuring the insulated gate bipolar transistor (IGBT) junction temperature using the collector voltage dV/dt at turn-OFF is outlined. A theoretical closed-form expression for the dV/dt at turn-OFF is derived, closely agreeing with experimental measurements. The role of dV/dt in dynamic avalanche in high-voltage IGBTs is also discussed. Finally, the implications of the temperature dependence of the dV/dt are discussed, including implementation of such a temperature measurement technique. © 2006 IEEE.

Item Type: Article
Uncontrolled Keywords: Converter dynamic avalanche power electro-nics power semiconductor device reliability
Subjects: UNSPECIFIED
Divisions: Div B > Electronics, Power & Energy Conversion
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 11:21
Last Modified: 08 Dec 2014 02:27
DOI: 10.1109/TPEL.2011.2125803