CUED Publications database

Interface Charge Trapping and Hot Carrier Reliability in High Voltage SOI SJ LDMOSFET

Antoniou, M and Udrea, F and Tee, EKC and Hao, Y and Pilkington, S and Yaw, KK and Pal, DK and Hoelke, A (2011) Interface Charge Trapping and Hot Carrier Reliability in High Voltage SOI SJ LDMOSFET. In: UNSPECIFIED pp. 336-339..

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Uncontrolled Keywords: TRANSISTORS DEGRADATION
Subjects: UNSPECIFIED
Divisions: Div B > Electronics, Power & Energy Conversion
Depositing User: Cron Job
Date Deposited: 18 May 2016 17:46
Last Modified: 25 Jul 2016 10:15
DOI: