Zhu, H and Chu, DP (2011) A study of capacitance-voltage characteristics of lead zirconate titanate ferroelectric thin films and their usage to investigate polarization and coercive field. J Phys Condens Matter, 23. 495901-.Full text not available from this repository.
Capacitance-voltage (C-V) characteristics of lead zirconate titanate (PZT) thin films with a thickness of 130 nm were measured between 300 and 533 K. The transition between ferroelectric and paraelectric phases was revealed to be of second order in our case, with a Curie temperature at around 450 K. A linear relationship was found between the measured capacitance and the inverse square root of the applied voltage. It was shown that such a relationship could be fitted well by a universal expression of C/A = k(V+V(0))(-1/2) and that this expression could be derived by expanding the Landau-Devonshire free energy at an effective equilibrium position of the Ti/Zr ion in a PZT unit cell. By using the derived equations in this work, the free energy parameters for an individual material can be obtained solely from the corresponding C-V data, and the temperature dependences of both remnant polarization and coercive voltage are shown to be in quantitative agreement with the experimental data.
|Uncontrolled Keywords:||Electric Capacitance Electricity Iron Compounds Lead Magnetics Nanostructures Titanium Zirconium|
|Divisions:||Div B > Photonics|
|Depositing User:||Unnamed user with email email@example.com|
|Date Deposited:||15 Dec 2015 13:16|
|Last Modified:||09 Feb 2016 22:02|