Zhu, H and Chu, DP (2011) A study of capacitance-voltage characteristics of lead zirconate titanate ferroelectric thin films and their usage to investigate polarization and coercive field. J Phys Condens Matter, 23. 495901-.
Full text not available from this repository.Abstract
Capacitance-voltage (C-V) characteristics of lead zirconate titanate (PZT) thin films with a thickness of 130 nm were measured between 300 and 533 K. The transition between ferroelectric and paraelectric phases was revealed to be of second order in our case, with a Curie temperature at around 450 K. A linear relationship was found between the measured capacitance and the inverse square root of the applied voltage. It was shown that such a relationship could be fitted well by a universal expression of C/A = k(V+V(0))(-1/2) and that this expression could be derived by expanding the Landau-Devonshire free energy at an effective equilibrium position of the Ti/Zr ion in a PZT unit cell. By using the derived equations in this work, the free energy parameters for an individual material can be obtained solely from the corresponding C-V data, and the temperature dependences of both remnant polarization and coercive voltage are shown to be in quantitative agreement with the experimental data.
Item Type: | Article |
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Uncontrolled Keywords: | Electric Capacitance Electricity Iron Compounds Lead Magnetics Nanostructures Titanium Zirconium |
Subjects: | UNSPECIFIED |
Divisions: | Div B > Photonics |
Depositing User: | Cron Job |
Date Deposited: | 17 Jul 2017 19:30 |
Last Modified: | 18 Feb 2021 15:41 |
DOI: | 10.1088/0953-8984/23/49/495901 |