CUED Publications database

Effect of gate dielectric scaling in nanometer scale vertical thin film transistors

Moradi, M and Fomani, AA and Nathan, A (2011) Effect of gate dielectric scaling in nanometer scale vertical thin film transistors. Applied Physics Letters, 99. ISSN 0003-6951

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 11:22
Last Modified: 13 Oct 2014 01:12
DOI: