CUED Publications database

Atomic mechanism of flat-band voltage shifts by La2O3 and Al2O3 in gate stacks

Robertson, J and Lin, L (2009) Atomic mechanism of flat-band voltage shifts by La2O3 and Al2O3 in gate stacks. Applied Physics Letters, 95.

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 12:41
Last Modified: 17 Mar 2014 15:02
DOI: