Singh, SK and Guedon, F and McMahon, R and Weier, S (2010) Parameter extraction and calorimetric validation for a silicon carbide jfet pspice model. IET Conference Publications, 2010.Full text not available from this repository.
This paper focuses on the PSpice model of SiC-JFET element inside a SiCED cascode device. The device model parameters are extracted from the I-V and C-V characterization curves. In order to validate the model, an inductive test rig circuit is designed and tested. The switching loss is estimated both using oscilloscope and calorimeter. These results are found to be in good agreement with the simulated results.
|Divisions:||Div B > Electronics, Power & Energy Conversion|
|Depositing User:||Cron Job|
|Date Deposited:||15 Dec 2015 13:07|
|Last Modified:||05 Feb 2016 03:03|