Lin, L and Robertson, J (2012) Passivation of interfacial defects at III-V oxide interfaces. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 30. ISSN 1071-1023
Full text not available from this repository.| Item Type: | Article |
|---|---|
| Subjects: | UNSPECIFIED |
| Divisions: | Div B > Solid State Electronics and Nanoscale Science |
| Depositing User: | Cron Job |
| Date Deposited: | 07 Mar 2014 11:40 |
| Last Modified: | 28 Jul 2014 01:07 |
| DOI: | 10.1116/1.4710513 |
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