Lin, L and Robertson, J (2012) Passivation of interfacial defects at III-V oxide interfaces. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 30. ISSN 1071-1023
Full text not available from this repository.Item Type: | Article |
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Subjects: | UNSPECIFIED |
Divisions: | Div B > Solid State Electronics and Nanoscale Science |
Depositing User: | Cron Job |
Date Deposited: | 17 Jul 2017 19:56 |
Last Modified: | 08 Mar 2018 01:53 |
DOI: |