Rawlings, C and Durkan, C (2012) Performing quantitative MFM measurements on soft magnetic nanostructures. Nanotechnology, 23. 455701-.Full text not available from this repository.
We have extended our previous work (Rawlings et al 2010 Phys. Rev. B 82 085404) on simulating magnetic force microscopy (MFM) images for magnetically soft samples to include an accurate representation of coated MFM tips. We used an array of square 500 nm nanomagnets to evaluate our improved MFM model. A quantitative comparison between model and experiment was performed for lift heights ranging from 20 to 100 nm. No fitting parameters were used in our comparison. For all lift heights the qualitative agreement between model and experiment was significantly improved. At low lift heights, where the magnetic signal was strong, the difference between theory and experiment was less than 30%.
|Divisions:||Div B > Solid State Electronics and Nanoscale Science|
|Depositing User:||Cron Job|
|Date Deposited:||07 Mar 2014 11:29|
|Last Modified:||17 Mar 2014 14:51|
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