CUED Publications database

Occurrence of particle debris field during focused Ga ion beam milling of glassy carbon

Hu, Q and O'Neill, W (2010) Occurrence of particle debris field during focused Ga ion beam milling of glassy carbon. Applied Surface Science, 256. pp. 5952-5956. ISSN 0169-4332

Full text not available from this repository.
Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div E > Production Processes
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 11:29
Last Modified: 10 Mar 2014 17:50
DOI: