Rawlings, C and Durkan, C (2012) *Calibration of the spring constant of cantilevers of arbitrary shape using the phase signal in an atomic force microscope.* Nanotechnology, 23. 485708-.

## Abstract

The measurement of cantilever parameters is an essential part of performing a calibrated measurement with an atomic force microscope (AFM). The thermal motion method is a widely used technique for calibrating the spring constant of an AFM cantilever, which can be applied to non-rectangular cantilevers. Given the trend towards high frequency scanning, calibration of non-rectangular cantilevers is of increasing importance. This paper presents two results relevant to cantilever calibration via the thermal motion method. We demonstrate the possibility of using the AFM's phase signal to acquire the thermal motion. This avoids the challenges associated with connecting the raw photodiode signal to a separate spectrum analyser. We also describe how numerical calculations may be used to calculate the parameters needed in a thermal motion calibration of a non-rectangular cantilever. Only accurate knowledge of the relative size of the in-plane dimensions of the cantilever is needed in this computation. We use this pair of results in the calibration of a variety of rectangular and non-rectangular cantilevers. We observe an average difference between the Sader and thermal motion values of cantilever stiffness of 10%.

Item Type: | Article |
---|---|

Subjects: | UNSPECIFIED |

Divisions: | Div B > Solid State Electronics and Nanoscale Science |

Depositing User: | Cron Job |

Date Deposited: | 09 Dec 2016 17:14 |

Last Modified: | 20 Mar 2017 07:21 |

DOI: |